This repository is an attempt at extracting data points from an ion probe tool at the Minnesota Nano Center. The aim is to highlight the primary peaks over time for optimizing ion milling dry etching times for a given thin film sample.
sims image-processing data-extraction fft process-engineering thin-films secondary-ion-mass-spectroscopy ion-millling ion-mill
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Updated
Jan 5, 2025 - Jupyter Notebook