Support non v6 boards

firmware/open_evse/Gfi.cpp

@@ -30,6 +30,7 @@ void gfi_isr()
 
 void Gfi::Init(uint8_t v6)
 {
+  is_v6 = v6;
   pin.init(GFI_REG,GFI_IDX,DigitalPin::INP);
   // GFI triggers on rising edge
   attachInterrupt(GFI_INTERRUPT,gfi_isr,RISING);
@@ -38,24 +39,26 @@ void Gfi::Init(uint8_t v6)
   volatile uint8_t *reg = GFITEST_REG;
   volatile uint8_t idx  = GFITEST_IDX;
 #ifdef OEV6
-  if (v6) {
+  if (is_v6) {
     reg = V6_GFITEST_REG;
-    idx  = V6_GFITEST_IDX;
+    idx = V6_GFITEST_IDX;
   }
 #endif // OEV6
   pinTest.init(reg,idx,DigitalPin::OUT);
-#endif
-#ifdef DC_GFCI_TEST
-  //volatile uint8_t *dcreg = DC_TEST_REG;
-  //volatile uint8_t dcidx  = DCTEST_IDX;
+#ifdef DC_GFI_TEST
 #ifdef OEV6
   if (v6) {
     pinMode(V6_DC_TEST_PIN,OUTPUT);
+  } else {
+#endif // OEV6
+    volatile uint8_t *dcreg = DC_TEST_REG;
+    volatile uint8_t dcidx  = DC_TEST_IDX;
+    pinDCTest.init(dcreg,dcidx,DigitalPin::OUT);
+#ifdef OEV6
   }
-#else
-  //pinDCTest.init(reg,idx,DigitalPin::OUT);
 #endif // OEV6
-#endif //DC_GFCI_TEST
+#endif //DC_GFI_TEST
+#endif //GFI_SELFTEST
 
   Reset();
 }
@@ -105,22 +108,38 @@ uint8_t Gfi::SelfTest()
   }
   if (i == 40) return 3;
 
-#ifdef DC_GFCI_TEST
+#ifdef DC_GFI_TEST
   if (testSuccess) {  //no point continuing unless AC test was successful
     testSuccess = 0;
     // turn on DC test pin
+#ifdef OEV6
+    if (is_v6) {
 #ifdef V6_DC_TEST_PIN
-    digitalWrite(V6_DC_TEST_PIN,HIGH);
+      digitalWrite(V6_DC_TEST_PIN,HIGH);
 #endif
+    } else {
+#endif //OEV6
+    pinDCTest.write(1);
+#ifdef OEV6
+    }
+#endif //OEV6
     for(int i=0; !testSuccess && (i < GFI_TEST_CYCLES); i++) {
       //just wait this time...
       delayMicroseconds(GFI_PULSE_ON_US);
       delayMicroseconds(GFI_PULSE_OFF_US);
     }
     //turn off the DC test pin
+#ifdef OEV6
+    if (is_v6) {
 #ifdef V6_DC_TEST_PIN
-    digitalWrite(V6_DC_TEST_PIN,LOW);
-#endif 
+      digitalWrite(V6_DC_TEST_PIN,LOW);
+#endif
+    } else {
+#endif //OEV6
+    pinDCTest.write(0);
+#ifdef OEV6
+    }
+#endif //OEV6
     // wait for GFI pin to clear
     for (i=0;i < 40;i++) {
       WDT_RESET();
@@ -130,7 +149,7 @@ uint8_t Gfi::SelfTest()
     if (i == 40) return 4;
   }
   //if testSuccess == 1 at this point then both tests were successful
-#endif //DC_GFCI_TEST
+#endif //DC_GFI_TEST
 
 #ifndef OPENEVSE_2
   // sometimes getting spurious GFI faults when testing just before closing

firmware/open_evse/Gfi.h

@@ -25,14 +25,18 @@
 class Gfi {
   DigitalPin pin;
   uint8_t m_GfiFault;
+  uint8_t is_v6;
 #ifdef GFI_SELFTEST
   uint8_t testSuccess;
   uint8_t testInProgress;
 #endif // GFI_SELFTEST
 public:
 #ifdef GFI_SELFTEST
   DigitalPin pinTest;
-#endif
+#ifdef DC_GFI_TEST
+  DigitalPin pinDCTest;
+#endif  //DC_GFI_TEST
+#endif  //GFI_SELFTEST
 
   Gfi() {}
 

firmware/open_evse/open_evse.h

@@ -177,7 +177,7 @@ extern AutoCurrentCapacityController g_ACCController;
 #define GFI_SELFTEST
 // If you loop a single turn of wire from the 12V supply through a 2k resistor to the
 // second DC relay pin, enable this for DC fault test
-//#define DC_GFCI_TEST
+//#define DC_GFI_TEST
 
 // behavior specified by UL
 // 1) if enabled, POST failure will cause a hard fault until power cycled.
@@ -495,7 +495,7 @@ extern AutoCurrentCapacityController g_ACCController;
 #define CHARGING_REG &PINB
 #define CHARGING_IDX 0
 
-#ifdef DC_GFCI_TEST
+#ifdef DC_GFI_TEST
 // 6ma DC leakage test when this pin is high
 #define V6_DC_TEST_PIN 6
 #define DC_TEST_REG &PIND
@@ -505,7 +505,7 @@ extern AutoCurrentCapacityController g_ACCController;
 #define V6_CHARGING_PIN2 6
 #define CHARGING2_REG &PIND
 #define CHARGING2_IDX 7
-#endif //DC_GFCI_TEST
+#endif //DC_GFI_TEST
 
 //digital Charging pin for AC relay
 #define CHARGINGAC_REG &PINB

platformio.ini

@@ -80,7 +80,7 @@ build_src_flags=
 extends = env:openevse
 build_src_flags=
   ${common.eu_build_flags}
-  -D DC_GFCI_TEST
+  -D DC_GFI_TEST
   -D MV_FOR_L2=240000L
   -D 'VERSION="${common.version}.EUDC"'