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Silicon drift detector (SDD) simulation on Geant4
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Author: Kunal Kumar (kunal.kumar@ovgu.de)
Citation: Kumar K, Fachet M, Hoeschen C. High-Spatial-Resolution Benchtop X-ray Fluorescence Imaging
through Bragg-Diffraction-Based Focusing with Bent Mosaic Graphite Crystals: A Simulation Study.
Int J Mol Sci. 2024 Apr 26;25(9):4733. doi: 10.3390/ijms25094733. PMID: 38731956; PMCID: PMC11083219.
DOI: 10.3390/ijms25094733; PMID: 38731956; PMCID: PMC11083219
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15/11/23 K. Kumar
- Created.