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Software for ptychography reconstruction and other quantitative interpretation of diffraction patterns #6

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uellue opened this issue Oct 12, 2021 · 0 comments

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@uellue
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uellue commented Oct 12, 2021

Since this doesn't quite fit individual methods, but rather a specific family of data analysis methods that requires similar data and metadata, I wasn't sure how to incorporate that in the existing lists.

Ptychography

Phase, orientation and strain mapping

Both ptychography and phase, orientation and strain mapping work with scanning diffraction data and require the following information or a subset of it:

  • Physical coordinates of scan points in the specimen coordinate system
  • Relation between detector coordinates and scattering coordinates:
    • Center, optical axis position on the detector
    • Diffraction angle per pixel (for example as camera length and physical detector pixel size, or radius of the incident beam in px combined with convergence semi-angle for STEM)
    • Rotation+handedness relative to scan coordinates -- problem area for scanning diffraction since easy to mix up in some way
  • Incident wavelength
    • Photon energy, electron energy, wavelength are equivalent
  • Incident illumination. Usually a convergence angle and possibly defocus are used for STEM since it often works with a convergent focused beam. Generally, a complex-valued function in the specimen plane describes the incident radiation.
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