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Since this doesn't quite fit individual methods, but rather a specific family of data analysis methods that requires similar data and metadata, I wasn't sure how to incorporate that in the existing lists.
Both ptychography and phase, orientation and strain mapping work with scanning diffraction data and require the following information or a subset of it:
Physical coordinates of scan points in the specimen coordinate system
Relation between detector coordinates and scattering coordinates:
Center, optical axis position on the detector
Diffraction angle per pixel (for example as camera length and physical detector pixel size, or radius of the incident beam in px combined with convergence semi-angle for STEM)
Rotation+handedness relative to scan coordinates -- problem area for scanning diffraction since easy to mix up in some way
Incident wavelength
Photon energy, electron energy, wavelength are equivalent
Incident illumination. Usually a convergence angle and possibly defocus are used for STEM since it often works with a convergent focused beam. Generally, a complex-valued function in the specimen plane describes the incident radiation.
The text was updated successfully, but these errors were encountered:
Since this doesn't quite fit individual methods, but rather a specific family of data analysis methods that requires similar data and metadata, I wasn't sure how to incorporate that in the existing lists.
Ptychography
Phase, orientation and strain mapping
Both ptychography and phase, orientation and strain mapping work with scanning diffraction data and require the following information or a subset of it:
The text was updated successfully, but these errors were encountered: